JTAG Manufacturing Test Creation, JTAG Debug and JTAG FLASH Programming

Boundary-Scan Test Creation: Writing JTAG Board Test Scripts for Device Programming, Prototype Bring Up, JTAG Test and JTAG Debug

 

JTAG Test Creation

 

XJEASE provides a fast flexible way to do board/hardware bring-up, JTAG FLASH and PLD Programming and JTAG IEEE 1149.1 Boundary-Scan test of your embedded system or product. XJEASE is a C-like scripting language that makes it simple to create JTAG tests for all components in your system.

 

XJEASE is a cost effective way to create JTAG hardware bring up and JTAG manufacturing tests which can be stepped, debugged and run in the XJEASE environment and used in our production environment JRUNNER. In addition, using the COM interface to JRUNNER you can create a JTAG Boundary Scan GUI interface that has full access to all tests written in XJEASE.

 

 

 

New Board Bring-Up Initialisition and Debug

XJEASE provides a fast flexible way to do board/hardware bring-up, JTAG FLASH Programming and JTAG test of your embedded system or product. XJEASE is a C-like scripting language that makes it simple to create JTAG tests for all components in your system.

 

let's you communicate with your target system over JTAG. For a new board with no boot ROM or FLASH, this is the only way to get your target properly configured so that you can begin to test your new hardware.

 

 

JTAG Memory and Register Read/Write

Using Memory and register read/write services of the JTAG Debugger, you can peek and poke your system to see what is working and what needs to be addressed. Changing registers on-the-fly let's you try new settings quickly to verify your system

JTAG Memory Tests

JTAG Boundary-Scan driven memory tests are built into the system allowing you to do more extensive testing of your memory subsystem. These 'canned' routines, save you the time and trouble of writing them yourself and best of all, since they use JTAG, they are available as soon as you plug into your target.

JTAG Debugger Based FLASH Programming

Once you have verified that your target has clock, power and that basic memory is accessible, you will want to program your target's FLASH device Using your JTAG Debuggers built-in FLASH utilities. Agile-DB provides extensive support for all popular FLASH devices and support fast flexible FLASH operations like: Erase, Program, ID, and Verify.

 

XJEASE is a cost effective way to create JTAG hardware bring up and JTAG manufacturing tests which can be stepped, debugged and run in the XJEASE environment or used in our production environment JRUNNER.

 

XJEASE created tests that are run using our JTAG test hardware.

 
Source and Assembly Level Stepping

The XJEASE Debugger allows you to step through your JTAG Test code one line at a time. This allows you to watch you programs variables as you step and to quickly detect problems in your code.
 

Code Break Points

Break Points allow you to set conditions that will cause you program to stop when the conditions are met. This allows you to stop and inspect your target's state and verify that it is what you expect befor continuing.


The following unique, powerful features are available in Agile-DB, but are not typically available in JTAG debug tools:

Auto ID

Auto ID uses JTAG to detect the processor and FLASh device on your target system.
Target Snapshot

BSDL Pin Scan

BSDL displays the state of each processor pin. This is useful to determine why a system may have crashed.